Reconstruction of thickness variation of a dielectric coating through the generalized impedance boundary conditions
We deal with an inverse scattering problem whose aim is to determine the thickness variation of a dielectric thin coating located on a conducting structure of unknown shape. The inverse scattering problem is solved through the application of the Generalized Impedance Boundary Conditions (GIBCs) which contain the thickness, curvature as well as material properties of the coating and they have been obtained in the previous work [B. Aslanyürek, H. Haddar and H.Şahintürk, 48 (2011) 681–700] up to the...