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Automatic parametric fault detection in complex analog systems based on a method of minimum node selection

Adrian BilskiJacek Wojciechowski — 2016

International Journal of Applied Mathematics and Computer Science

The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and...

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