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Numerical study of the systematic error in Monte Carlo schemes for semiconductors

Orazio MuscatoWolfgang WagnerVincenza Di Stefano — 2010

ESAIM: Mathematical Modelling and Numerical Analysis

The paper studies the convergence behavior of Monte Carlo schemes for semiconductors. A detailed analysis of the systematic error with respect to numerical parameters is performed. Different sources of systematic error are pointed out and illustrated in a spatially one-dimensional test case. The error with respect to the number of simulation particles occurs during the calculation of the internal electric field. The time step error, which is related to the splitting of transport and electric field...

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