Plans d'échantillonnage progressifs par attributs. Application aux plans normalisés MIL-STD 105 D
Revue de Statistique Appliquée (1982)
- Volume: 30, Issue: 2, page 5-20
- ISSN: 0035-175X
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topVessereau, A.. "Plans d'échantillonnage progressifs par attributs. Application aux plans normalisés MIL-STD 105 D." Revue de Statistique Appliquée 30.2 (1982): 5-20. <http://eudml.org/doc/106134>.
@article{Vessereau1982,
author = {Vessereau, A.},
journal = {Revue de Statistique Appliquée},
keywords = {binomial distribution; acceptance regions; sequential probability ratio tests; Poisson distribution; tables; sample sizes; simple sampling plans; ISO 2859; rejection regions; MIL-STD 105 D},
language = {fre},
number = {2},
pages = {5-20},
publisher = {Société de Statistique de France},
title = {Plans d'échantillonnage progressifs par attributs. Application aux plans normalisés MIL-STD 105 D},
url = {http://eudml.org/doc/106134},
volume = {30},
year = {1982},
}
TY - JOUR
AU - Vessereau, A.
TI - Plans d'échantillonnage progressifs par attributs. Application aux plans normalisés MIL-STD 105 D
JO - Revue de Statistique Appliquée
PY - 1982
PB - Société de Statistique de France
VL - 30
IS - 2
SP - 5
EP - 20
LA - fre
KW - binomial distribution; acceptance regions; sequential probability ratio tests; Poisson distribution; tables; sample sizes; simple sampling plans; ISO 2859; rejection regions; MIL-STD 105 D
UR - http://eudml.org/doc/106134
ER -
References
top- [1] Wald A. - Sequential analysis. John Wiley & Sons, London & New-York, (1947). Zbl0029.15805MR20764
- [2] WETHERILL - Sequential methods in statistics. Traduction française par P. Gabe "Méthodes séquentielles en statistique" Dunod, Paris (1969).
- [3] INDIAN STANDARD - IS.2500 (Part I). Inspection by attributes and by count of defects (1973).
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