An investigation of chaos in the R L -diode circuit using the BDS test.

Kasap, R.; Kurt, E.

Journal of Applied Mathematics and Decision Sciences (1998)

  • Volume: 2, Issue: 2, page 193-199
  • ISSN: 2090-3359

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Kasap, R., and Kurt, E.. "An investigation of chaos in the -diode circuit using the BDS test.." Journal of Applied Mathematics and Decision Sciences 2.2 (1998): 193-199. <http://eudml.org/doc/124141>.

@article{Kasap1998,
author = {Kasap, R., Kurt, E.},
journal = {Journal of Applied Mathematics and Decision Sciences},
language = {eng},
number = {2},
pages = {193-199},
publisher = {Hindawi Publishing Corporation, New York},
title = {An investigation of chaos in the -diode circuit using the BDS test.},
url = {http://eudml.org/doc/124141},
volume = {2},
year = {1998},
}

TY - JOUR
AU - Kasap, R.
AU - Kurt, E.
TI - An investigation of chaos in the -diode circuit using the BDS test.
JO - Journal of Applied Mathematics and Decision Sciences
PY - 1998
PB - Hindawi Publishing Corporation, New York
VL - 2
IS - 2
SP - 193
EP - 199
LA - eng
UR - http://eudml.org/doc/124141
ER -

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