Sample path properties of stable processes  -  Mijnheer, J.L.

G. Pflug

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Sample path properties of stable processes - Mijnheer, J.L.

G. Pflug

Metrika (1975)

Volume: 22, page 254-254
ISSN: 0026-1335; 1435-926X/e

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Pflug, G.. "Sample path properties of stable processes - Mijnheer, J.L.." Metrika 22 (1975): 254-254. <http://eudml.org/doc/175689>.

@article{Pflug1975,
author = {Pflug, G.},
journal = {Metrika},
pages = {254-254},
title = {Sample path properties of stable processes - Mijnheer, J.L.},
url = {http://eudml.org/doc/175689},
volume = {22},
year = {1975},
}

TY - JOUR
AU - Pflug, G.
TI - Sample path properties of stable processes - Mijnheer, J.L.
JO - Metrika
PY - 1975
VL - 22
SP - 254
EP - 254
UR - http://eudml.org/doc/175689
ER -