Optimal Tests and Estimators for Truncated Exponential Families.

M.A. Beg

Metrika (1982)

  • Volume: 29, page 103-114
  • ISSN: 0026-1335; 1435-926X/e

How to cite

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Beg, M.A.. "Optimal Tests and Estimators for Truncated Exponential Families.." Metrika 29 (1982): 103-114. <http://eudml.org/doc/175844>.

@article{Beg1982,
author = {Beg, M.A.},
journal = {Metrika},
keywords = {truncated exponential families; Blackwell-Rao-Lehmann-Scheffe theory; minimum variance unbiased estimators; uniformly most powerful unbiased tests},
pages = {103-114},
title = {Optimal Tests and Estimators for Truncated Exponential Families.},
url = {http://eudml.org/doc/175844},
volume = {29},
year = {1982},
}

TY - JOUR
AU - Beg, M.A.
TI - Optimal Tests and Estimators for Truncated Exponential Families.
JO - Metrika
PY - 1982
VL - 29
SP - 103
EP - 114
KW - truncated exponential families; Blackwell-Rao-Lehmann-Scheffe theory; minimum variance unbiased estimators; uniformly most powerful unbiased tests
UR - http://eudml.org/doc/175844
ER -

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