Economie Screening Procedures Based on Correlated Variables.

D.S. Bai; S.B. Kim; M.C. Riew

Metrika (1990)

  • Volume: 37, Issue: 5, page 263-280
  • ISSN: 0026-1335; 1435-926X/e

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Bai, D.S., Kim, S.B., and Riew, M.C.. "Economie Screening Procedures Based on Correlated Variables.." Metrika 37.5 (1990): 263-280. <http://eudml.org/doc/176307>.

@article{Bai1990,
author = {Bai, D.S., Kim, S.B., Riew, M.C.},
journal = {Metrika},
keywords = {outgoing product quality; screening variables; screening inspection; misclassification errors; closed-form solution; one-sided specification limits; two-sided specification limits; optimal solutions; t- distributions},
number = {5},
pages = {263-280},
title = {Economie Screening Procedures Based on Correlated Variables.},
url = {http://eudml.org/doc/176307},
volume = {37},
year = {1990},
}

TY - JOUR
AU - Bai, D.S.
AU - Kim, S.B.
AU - Riew, M.C.
TI - Economie Screening Procedures Based on Correlated Variables.
JO - Metrika
PY - 1990
VL - 37
IS - 5
SP - 263
EP - 280
KW - outgoing product quality; screening variables; screening inspection; misclassification errors; closed-form solution; one-sided specification limits; two-sided specification limits; optimal solutions; t- distributions
UR - http://eudml.org/doc/176307
ER -

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