a-Optimal Sampling Plans for Lot-by-Lot Defects Inspection.
- Volume: 39, Issue: 5, page 269-317
- ISSN: 0026-1335; 1435-926X/e
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topGöb, R.. "a-Optimal Sampling Plans for Lot-by-Lot Defects Inspection.." Metrika 39.5 (0): 269-317. <http://eudml.org/doc/176429>.
@article{Göb0,
author = {Göb, R.},
journal = {Metrika},
keywords = {linear cost model; gamma minimax principle; alpha-optimal sampling plans; lot-by-lot single sampling plans; lot OC function; economic cost and control model; single defects sampling plans; defects inspection; Poisson approximation},
number = {5},
pages = {269-317},
title = {a-Optimal Sampling Plans for Lot-by-Lot Defects Inspection.},
url = {http://eudml.org/doc/176429},
volume = {39},
year = {0},
}
TY - JOUR
AU - Göb, R.
TI - a-Optimal Sampling Plans for Lot-by-Lot Defects Inspection.
JO - Metrika
PY - 0
VL - 39
IS - 5
SP - 269
EP - 317
KW - linear cost model; gamma minimax principle; alpha-optimal sampling plans; lot-by-lot single sampling plans; lot OC function; economic cost and control model; single defects sampling plans; defects inspection; Poisson approximation
UR - http://eudml.org/doc/176429
ER -
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