A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions

Nguyen Thanh Tien; Pham Thi Bich Thao; Le Tuan

Nanoscale Systems: Mathematical Modeling, Theory and Applications (2014)

  • Volume: 3, Issue: 1
  • ISSN: 2299-3290

Abstract

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We propose a modification of the interface roughness (IFR) scattering form factor in intersubband transitions.We properly derived a formula for the form factor for IFR scattering in terms of the integrals of the envelope wave functions. This novel form factor is more global nature than the old one (proposed by Ando) and may be suitable for a wide range of applications. In this paper, we calculate and compare the absorption linewidth with the application of the old form factor and novel one. In different from previous calculations, with the same surface profile (Δ, Λ), the calculation results the interface roughness scattering absorption linewidth with the application of the new form factor is greater than twice the old one. Our numerical calculations may better explain the experimental results the well-width dependence of intersubband absorption linewidth.

How to cite

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Nguyen Thanh Tien, Pham Thi Bich Thao, and Le Tuan. "A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions." Nanoscale Systems: Mathematical Modeling, Theory and Applications 3.1 (2014): null. <http://eudml.org/doc/266654>.

@article{NguyenThanhTien2014,
abstract = {We propose a modification of the interface roughness (IFR) scattering form factor in intersubband transitions.We properly derived a formula for the form factor for IFR scattering in terms of the integrals of the envelope wave functions. This novel form factor is more global nature than the old one (proposed by Ando) and may be suitable for a wide range of applications. In this paper, we calculate and compare the absorption linewidth with the application of the old form factor and novel one. In different from previous calculations, with the same surface profile (Δ, Λ), the calculation results the interface roughness scattering absorption linewidth with the application of the new form factor is greater than twice the old one. Our numerical calculations may better explain the experimental results the well-width dependence of intersubband absorption linewidth.},
author = {Nguyen Thanh Tien, Pham Thi Bich Thao, Le Tuan},
journal = {Nanoscale Systems: Mathematical Modeling, Theory and Applications},
keywords = {Absorption linewidth; Intersubband transitions; Interface roughness scattering; Quantum well; Transition form factor},
language = {eng},
number = {1},
pages = {null},
title = {A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions},
url = {http://eudml.org/doc/266654},
volume = {3},
year = {2014},
}

TY - JOUR
AU - Nguyen Thanh Tien
AU - Pham Thi Bich Thao
AU - Le Tuan
TI - A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions
JO - Nanoscale Systems: Mathematical Modeling, Theory and Applications
PY - 2014
VL - 3
IS - 1
SP - null
AB - We propose a modification of the interface roughness (IFR) scattering form factor in intersubband transitions.We properly derived a formula for the form factor for IFR scattering in terms of the integrals of the envelope wave functions. This novel form factor is more global nature than the old one (proposed by Ando) and may be suitable for a wide range of applications. In this paper, we calculate and compare the absorption linewidth with the application of the old form factor and novel one. In different from previous calculations, with the same surface profile (Δ, Λ), the calculation results the interface roughness scattering absorption linewidth with the application of the new form factor is greater than twice the old one. Our numerical calculations may better explain the experimental results the well-width dependence of intersubband absorption linewidth.
LA - eng
KW - Absorption linewidth; Intersubband transitions; Interface roughness scattering; Quantum well; Transition form factor
UR - http://eudml.org/doc/266654
ER -

References

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