Estimation of the reliability function for an object that is improved on the basis of data on the life-lengths and types of failures of an object that is not improved

Joachim Domsta

Mathematica Applicanda (1983)

  • Volume: 11, Issue: 22
  • ISSN: 1730-2668

Abstract

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The author considers a population Π of devices which can fail due to one of the modes of failure Ui, i=1,2,...,k. Assume that each device e in Π has a life which will terminate at time T(e) due to mode Uj. When a device is drawn at random from Π, the pair [T(e),j] is a two-dimensional random variable with probability distribution P(T,j) which determines the marginal survival function R(t)=P{T>t}, called the "reliability function before improvement". The author discusses possible improvement of such a population by procedures of two types. Type I consists of removing from Π all devices with certain unfavorable qualities, for example, those that fail due to Uj within a test period tj for specified j and tj, or those for which one can tell beforehand that they will fail due to a specified Uj. Type II consists of modifying the devices (e.g., by changing the manufacturing process) in a way that will change the probability distribution P(T,j) into some P~(T,j). In view of the multiplicity of modes of failure, this leads to questions dealing with competing risks.

How to cite

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Joachim Domsta. "Estimation of the reliability function for an object that is improved on the basis of data on the life-lengths and types of failures of an object that is not improved." Mathematica Applicanda 11.22 (1983): null. <http://eudml.org/doc/292837>.

@article{JoachimDomsta1983,
abstract = {The author considers a population Π of devices which can fail due to one of the modes of failure Ui, i=1,2,...,k. Assume that each device e in Π has a life which will terminate at time T(e) due to mode Uj. When a device is drawn at random from Π, the pair [T(e),j] is a two-dimensional random variable with probability distribution P(T,j) which determines the marginal survival function R(t)=P\{T>t\}, called the "reliability function before improvement". The author discusses possible improvement of such a population by procedures of two types. Type I consists of removing from Π all devices with certain unfavorable qualities, for example, those that fail due to Uj within a test period tj for specified j and tj, or those for which one can tell beforehand that they will fail due to a specified Uj. Type II consists of modifying the devices (e.g., by changing the manufacturing process) in a way that will change the probability distribution P(T,j) into some P~(T,j). In view of the multiplicity of modes of failure, this leads to questions dealing with competing risks.},
author = {Joachim Domsta},
journal = {Mathematica Applicanda},
keywords = {Reliability and life testing},
language = {eng},
number = {22},
pages = {null},
title = {Estimation of the reliability function for an object that is improved on the basis of data on the life-lengths and types of failures of an object that is not improved},
url = {http://eudml.org/doc/292837},
volume = {11},
year = {1983},
}

TY - JOUR
AU - Joachim Domsta
TI - Estimation of the reliability function for an object that is improved on the basis of data on the life-lengths and types of failures of an object that is not improved
JO - Mathematica Applicanda
PY - 1983
VL - 11
IS - 22
SP - null
AB - The author considers a population Π of devices which can fail due to one of the modes of failure Ui, i=1,2,...,k. Assume that each device e in Π has a life which will terminate at time T(e) due to mode Uj. When a device is drawn at random from Π, the pair [T(e),j] is a two-dimensional random variable with probability distribution P(T,j) which determines the marginal survival function R(t)=P{T>t}, called the "reliability function before improvement". The author discusses possible improvement of such a population by procedures of two types. Type I consists of removing from Π all devices with certain unfavorable qualities, for example, those that fail due to Uj within a test period tj for specified j and tj, or those for which one can tell beforehand that they will fail due to a specified Uj. Type II consists of modifying the devices (e.g., by changing the manufacturing process) in a way that will change the probability distribution P(T,j) into some P~(T,j). In view of the multiplicity of modes of failure, this leads to questions dealing with competing risks.
LA - eng
KW - Reliability and life testing
UR - http://eudml.org/doc/292837
ER -

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