A simple upper bound to the Bayes error probability for feature selection

Lorenzo Bruzzone; Sebastiano B. Serpico

Kybernetika (1998)

  • Volume: 34, Issue: 4, page [387]-392
  • ISSN: 0023-5954

Abstract

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In this paper, feature selection in multiclass cases for classification of remote-sensing images is addressed. A criterion based on a simple upper bound to the error probability of the Bayes classifier for the minimum error is proposed. This criterion has the advantage of selecting features having a link with the error probability with a low computational load. Experiments have been carried out in order to compare the performances provided by the proposed criterion with the ones of some of the widely used feature-selection criteria presented in the remote-sensing literature. These experiments confirm the effectiveness of the proposed criterion, which performs slightly better than all the others considered in the paper.

How to cite

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Bruzzone, Lorenzo, and Serpico, Sebastiano B.. "A simple upper bound to the Bayes error probability for feature selection." Kybernetika 34.4 (1998): [387]-392. <http://eudml.org/doc/33366>.

@article{Bruzzone1998,
abstract = {In this paper, feature selection in multiclass cases for classification of remote-sensing images is addressed. A criterion based on a simple upper bound to the error probability of the Bayes classifier for the minimum error is proposed. This criterion has the advantage of selecting features having a link with the error probability with a low computational load. Experiments have been carried out in order to compare the performances provided by the proposed criterion with the ones of some of the widely used feature-selection criteria presented in the remote-sensing literature. These experiments confirm the effectiveness of the proposed criterion, which performs slightly better than all the others considered in the paper.},
author = {Bruzzone, Lorenzo, Serpico, Sebastiano B.},
journal = {Kybernetika},
keywords = {Bayes error probability; feature selection; Bayes error probability; feature selection},
language = {eng},
number = {4},
pages = {[387]-392},
publisher = {Institute of Information Theory and Automation AS CR},
title = {A simple upper bound to the Bayes error probability for feature selection},
url = {http://eudml.org/doc/33366},
volume = {34},
year = {1998},
}

TY - JOUR
AU - Bruzzone, Lorenzo
AU - Serpico, Sebastiano B.
TI - A simple upper bound to the Bayes error probability for feature selection
JO - Kybernetika
PY - 1998
PB - Institute of Information Theory and Automation AS CR
VL - 34
IS - 4
SP - [387]
EP - 392
AB - In this paper, feature selection in multiclass cases for classification of remote-sensing images is addressed. A criterion based on a simple upper bound to the error probability of the Bayes classifier for the minimum error is proposed. This criterion has the advantage of selecting features having a link with the error probability with a low computational load. Experiments have been carried out in order to compare the performances provided by the proposed criterion with the ones of some of the widely used feature-selection criteria presented in the remote-sensing literature. These experiments confirm the effectiveness of the proposed criterion, which performs slightly better than all the others considered in the paper.
LA - eng
KW - Bayes error probability; feature selection; Bayes error probability; feature selection
UR - http://eudml.org/doc/33366
ER -

References

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  1. Bruzzone L., Roli F., Serpico S. B., 10.1109/36.477187, IEEE Trans. Geoscience Remote Sensing 33 (1995), 6, 1318–1321 (1995) DOI10.1109/36.477187
  2. Bruzzone L., Serpico S. B., Feature selection in multiclass cases: a proposal and an experimental investigation, In: Proceedings of the 1st Workshop on Statistical Techniques in Pattern Recognition, Prague 1997, pp. 19–24 (1997) 
  3. Fukunaga K., Introduction to Statistical Pattern Recognition, Second edition. Academic, New York 1990 Zbl0711.62052MR1075415
  4. Liu S. S., Jernigan M. E., 10.1016/0734-189X(90)90162-O, Computer Vision Image Processing 49 (1990), 52–67 (1990) DOI10.1016/0734-189X(90)90162-O
  5. Swain P. H., Davis S. M., Remote Sensing: The Quantitative Approach, McGraw–Hill, New York 1994 
  6. Tou J. T., Gonzalez R. C., Pattern Recognition Principles, Addison–Wesley, London 1974 Zbl0299.68058MR0449069

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