A representation formula for the voltage perturbations caused by diametrically small conductivity inhomogeneities. Proof of uniform validity
Hoai-Minh Nguyen; Michael S. Vogelius
Annales de l'I.H.P. Analyse non linéaire (2009)
- Volume: 26, Issue: 6, page 2283-2315
- ISSN: 0294-1449
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topNguyen, Hoai-Minh, and Vogelius, Michael S.. "A representation formula for the voltage perturbations caused by diametrically small conductivity inhomogeneities. Proof of uniform validity." Annales de l'I.H.P. Analyse non linéaire 26.6 (2009): 2283-2315. <http://eudml.org/doc/78934>.
@article{Nguyen2009,
author = {Nguyen, Hoai-Minh, Vogelius, Michael S.},
journal = {Annales de l'I.H.P. Analyse non linéaire},
keywords = {voltage representation formulas; small inhomogeneities; cloaking},
language = {eng},
number = {6},
pages = {2283-2315},
publisher = {Elsevier},
title = {A representation formula for the voltage perturbations caused by diametrically small conductivity inhomogeneities. Proof of uniform validity},
url = {http://eudml.org/doc/78934},
volume = {26},
year = {2009},
}
TY - JOUR
AU - Nguyen, Hoai-Minh
AU - Vogelius, Michael S.
TI - A representation formula for the voltage perturbations caused by diametrically small conductivity inhomogeneities. Proof of uniform validity
JO - Annales de l'I.H.P. Analyse non linéaire
PY - 2009
PB - Elsevier
VL - 26
IS - 6
SP - 2283
EP - 2315
LA - eng
KW - voltage representation formulas; small inhomogeneities; cloaking
UR - http://eudml.org/doc/78934
ER -
References
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