From the Slit-Island Method to the Ising model: Analysis of irregular grayscale objects
The Slit Island Method (SIM) is a technique for the estimation of the fractal dimension of an object by determining the area-perimeter relations for successive slits. The SIM could be applied for image analysis of irregular grayscale objects and their classification using the fractal dimension. It is known that this technique is not functional in some cases. It is emphasized in this paper that for specific objects a negative or an infinite fractal dimension could be obtained. The transformation...