Displaying similar documents to “A discrete-time software reliability-growth model and its application for predicting the number of errors encountered during program testing”

Parametric test for change in a parameter occurring in the density of one-parameter exponential family

van Huu Nguyen (1980)

Aplikace matematiky

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The problem of testing hypothesis under which the observations are independent, identically distributed against a class of alternatives of regression in a parameter of the one-parameter exponential family is studied. A parametric test for this problem is suggested. The relative efficiency of the parametric test compared to the rank test proposed in the author's preceding paper is also derived.

Bayesian inference and optimal release times. For two software failure models

W. P. Wiper, D. Ríos Insua, R. Hierons (1998)

Revista de la Real Academia de Ciencias Exactas Físicas y Naturales

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We carry out Bayesian inference for the Jelinski-Moranda and Littlewood software failure models given a sample of failure times. Furthermore, we illustrate how to assess the optimal length of an additional pre-release testing period under each of these models. Modern Bayesian computational methods are used to estimate the posterior expected utility of testing for and additional time.

A nonparametric test of zero intrapair correlation

Antonín Lukš (1983)

Aplikace matematiky

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The author applies the test criterion of P. Rothety to the statistical analysis of the positive correclation of symmetric pairs of observations. In this particular case he arrives at some new results. His work ends with a general proof of the consistency of Rothery's test.