Local correlation and entropy maps as tools for detecting defects in industrial images
Ewa Skubalska-Rafajłowicz (2008)
International Journal of Applied Mathematics and Computer Science
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The aim of this paper is to propose two methods of detecting defects in industrial products by an analysis of gray level images with low contrast between the defects and their background. An additional difficulty is the high nonuniformity of the background in different parts of the same image. The first method is based on correlating subimages with a nondefective reference subimage and searching for pixels with low correlation. To speed up calculations, correlations are replaced by a...