Optimal sofware release policies for software reliability growth models under imperfect debugging
RAIRO - Operations Research - Recherche Opérationnelle (1990)
- Volume: 24, Issue: 3, page 295-305
- ISSN: 0399-0559
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topKapur, P. K., and Garg, R. B.. "Optimal sofware release policies for software reliability growth models under imperfect debugging." RAIRO - Operations Research - Recherche Opérationnelle 24.3 (1990): 295-305. <http://eudml.org/doc/104988>.
@article{Kapur1990,
author = {Kapur, P. K., Garg, R. B.},
journal = {RAIRO - Operations Research - Recherche Opérationnelle},
keywords = {life cycle; software; imperfect debugging; release policies},
language = {eng},
number = {3},
pages = {295-305},
publisher = {EDP-Sciences},
title = {Optimal sofware release policies for software reliability growth models under imperfect debugging},
url = {http://eudml.org/doc/104988},
volume = {24},
year = {1990},
}
TY - JOUR
AU - Kapur, P. K.
AU - Garg, R. B.
TI - Optimal sofware release policies for software reliability growth models under imperfect debugging
JO - RAIRO - Operations Research - Recherche Opérationnelle
PY - 1990
PB - EDP-Sciences
VL - 24
IS - 3
SP - 295
EP - 305
LA - eng
KW - life cycle; software; imperfect debugging; release policies
UR - http://eudml.org/doc/104988
ER -
References
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- 10. S. YAMADA, S. OSAKI and H. NARIHISA, A Software Reliability Growth Model with Two Types of Errors, R.A.I.R.O. Rech. Oper., 1985, 19. (1), pp. 87-104. Zbl0566.68029
- 11. S. YAMADA, T. YAMANE and S. OSAKI, Software Reliability Growth Models with Error Debugging Rate (in Japanese), Trans. Information Processing Soc. Japan, 1986, 27, (1), pp. 64-71.
- 12. S. YAMADA, H. NARIHISA and H. OHTERA, Non-Homogeneous Software Error Detection Rate Model: Data Analysis and Applications, R.A.I.R.O., Rech. Oper., 1986, 20, (1), pp. 51-60. Zbl0596.68034
- 13. S. YAMADA and S. OSAKI, Optimal Software Release Policies with Simultaneous Cost and Reliability Requirements, Eur. J. Oper. Res., 1987, 31, pp. 46-51. Zbl0614.90041MR894595
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