Bicriterion release policy for exponential software reliability growth model
P. K. Kapur; Sanjay Agarwala; R. B. Garg
RAIRO - Operations Research - Recherche Opérationnelle (1994)
- Volume: 28, Issue: 2, page 165-180
- ISSN: 0399-0559
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topKapur, P. K., Agarwala, Sanjay, and Garg, R. B.. "Bicriterion release policy for exponential software reliability growth model." RAIRO - Operations Research - Recherche Opérationnelle 28.2 (1994): 165-180. <http://eudml.org/doc/105080>.
@article{Kapur1994,
author = {Kapur, P. K., Agarwala, Sanjay, Garg, R. B.},
journal = {RAIRO - Operations Research - Recherche Opérationnelle},
keywords = {software release policy; software reliability; total expected cost},
language = {eng},
number = {2},
pages = {165-180},
publisher = {EDP-Sciences},
title = {Bicriterion release policy for exponential software reliability growth model},
url = {http://eudml.org/doc/105080},
volume = {28},
year = {1994},
}
TY - JOUR
AU - Kapur, P. K.
AU - Agarwala, Sanjay
AU - Garg, R. B.
TI - Bicriterion release policy for exponential software reliability growth model
JO - RAIRO - Operations Research - Recherche Opérationnelle
PY - 1994
PB - EDP-Sciences
VL - 28
IS - 2
SP - 165
EP - 180
LA - eng
KW - software release policy; software reliability; total expected cost
UR - http://eudml.org/doc/105080
ER -
References
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- 8. P. K. KAPUR and R. B. GARG, Optimum release policy for infiection S-shaped software reliability growth model, Micro. electron. & Reliab., 1991, pp. 39-42.
- 9. P. K. KAPUR and V. K. BHALLA, Optimal release policies for flexible software reliability growth model, Rel. Eng. & Sys. Safety, 35(1), 1992, pp. 49-54. Zbl0742.60083
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