Global existence and extinction of weak solutions to a class of semiconductor equations with fast diffusion terms.
Journal of Inequalities and Applications [electronic only] (2008)
- Volume: 2008, page Article ID 961045, 14 p.-Article ID 961045, 14 p.
- ISSN: 1029-242X
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topWu, Bin. "Global existence and extinction of weak solutions to a class of semiconductor equations with fast diffusion terms.." Journal of Inequalities and Applications [electronic only] 2008 (2008): Article ID 961045, 14 p.-Article ID 961045, 14 p.. <http://eudml.org/doc/117094>.
@article{Wu2008,
author = {Wu, Bin},
journal = {Journal of Inequalities and Applications [electronic only]},
keywords = {drift-diffusion model; Dirichlet-Neumann mixed boundary value problem; weak solutions},
language = {eng},
pages = {Article ID 961045, 14 p.-Article ID 961045, 14 p.},
publisher = {Springer International Publishing},
title = {Global existence and extinction of weak solutions to a class of semiconductor equations with fast diffusion terms.},
url = {http://eudml.org/doc/117094},
volume = {2008},
year = {2008},
}
TY - JOUR
AU - Wu, Bin
TI - Global existence and extinction of weak solutions to a class of semiconductor equations with fast diffusion terms.
JO - Journal of Inequalities and Applications [electronic only]
PY - 2008
PB - Springer International Publishing
VL - 2008
SP - Article ID 961045, 14 p.
EP - Article ID 961045, 14 p.
LA - eng
KW - drift-diffusion model; Dirichlet-Neumann mixed boundary value problem; weak solutions
UR - http://eudml.org/doc/117094
ER -
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