Gaussian scaling for the critical spread-out contact process above the upper critical dimension.

van der Hofstad, Remco, and Sakai, Akira. "Gaussian scaling for the critical spread-out contact process above the upper critical dimension.." Electronic Journal of Probability [electronic only] 9 (2004): 710-769. <http://eudml.org/doc/125395>.

@article{vanderHofstad2004,
author = {van der Hofstad, Remco, Sakai, Akira},
journal = {Electronic Journal of Probability [electronic only]},
keywords = {lace expansion},
language = {eng},
pages = {710-769},
publisher = {University of Washington, Department of Mathematics, Seattle, WA; Duke University, Department of Mathematics, Durham},
title = {Gaussian scaling for the critical spread-out contact process above the upper critical dimension.},
url = {http://eudml.org/doc/125395},
volume = {9},
year = {2004},
}

TY - JOUR
AU - van der Hofstad, Remco
AU - Sakai, Akira
TI - Gaussian scaling for the critical spread-out contact process above the upper critical dimension.
JO - Electronic Journal of Probability [electronic only]
PY - 2004
PB - University of Washington, Department of Mathematics, Seattle, WA; Duke University, Department of Mathematics, Durham
VL - 9
SP - 710
EP - 769
LA - eng
KW - lace expansion
UR - http://eudml.org/doc/125395
ER -