A New Bayesian Approach to Quality Control Charts.

W.K. Chiu; M.P.Y. Leung

Metrika (1980)

  • Volume: 27, page 243-254
  • ISSN: 0026-1335; 1435-926X/e

How to cite

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Chiu, W.K., and Leung, M.P.Y.. "A New Bayesian Approach to Quality Control Charts.." Metrika 27 (1980): 243-254. <http://eudml.org/doc/186219>.

@article{Chiu1980,
author = {Chiu, W.K., Leung, M.P.Y.},
journal = {Metrika},
keywords = {quality control charts; loss-cost function; economic optimum control charts},
pages = {243-254},
title = {A New Bayesian Approach to Quality Control Charts.},
url = {http://eudml.org/doc/186219},
volume = {27},
year = {1980},
}

TY - JOUR
AU - Chiu, W.K.
AU - Leung, M.P.Y.
TI - A New Bayesian Approach to Quality Control Charts.
JO - Metrika
PY - 1980
VL - 27
SP - 243
EP - 254
KW - quality control charts; loss-cost function; economic optimum control charts
UR - http://eudml.org/doc/186219
ER -

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