Address sequences and backgrounds with different Hamming distances for multiple run March tests

Svetlana Yarmolik

International Journal of Applied Mathematics and Computer Science (2008)

  • Volume: 18, Issue: 3, page 329-339
  • ISSN: 1641-876X

Abstract

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It is widely known that pattern sensitive faults are the most difficult faults to detect during the RAM testing process. One of the techniques which can be used for effective detection of this kind of faults is the multi-background test technique. According to this technique, multiple-run memory test execution is done. In this case, to achieve a high fault coverage, the structure of the consecutive memory backgrounds and the address sequence are very important. This paper defines requirements which have to be taken into account in the background and address sequence selection process. A set of backgrounds which satisfied those requirements guarantee us to achieve a very high fault coverage for multi-background memory testing.

How to cite

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Svetlana Yarmolik. "Address sequences and backgrounds with different Hamming distances for multiple run March tests." International Journal of Applied Mathematics and Computer Science 18.3 (2008): 329-339. <http://eudml.org/doc/207889>.

@article{SvetlanaYarmolik2008,
abstract = {It is widely known that pattern sensitive faults are the most difficult faults to detect during the RAM testing process. One of the techniques which can be used for effective detection of this kind of faults is the multi-background test technique. According to this technique, multiple-run memory test execution is done. In this case, to achieve a high fault coverage, the structure of the consecutive memory backgrounds and the address sequence are very important. This paper defines requirements which have to be taken into account in the background and address sequence selection process. A set of backgrounds which satisfied those requirements guarantee us to achieve a very high fault coverage for multi-background memory testing.},
author = {Svetlana Yarmolik},
journal = {International Journal of Applied Mathematics and Computer Science},
keywords = {random-access memory (RAM); memory testing; March memory test; neighbourhood pattern sensitive faults; memory address; memory background; Gray code; Hamming distance},
language = {eng},
number = {3},
pages = {329-339},
title = {Address sequences and backgrounds with different Hamming distances for multiple run March tests},
url = {http://eudml.org/doc/207889},
volume = {18},
year = {2008},
}

TY - JOUR
AU - Svetlana Yarmolik
TI - Address sequences and backgrounds with different Hamming distances for multiple run March tests
JO - International Journal of Applied Mathematics and Computer Science
PY - 2008
VL - 18
IS - 3
SP - 329
EP - 339
AB - It is widely known that pattern sensitive faults are the most difficult faults to detect during the RAM testing process. One of the techniques which can be used for effective detection of this kind of faults is the multi-background test technique. According to this technique, multiple-run memory test execution is done. In this case, to achieve a high fault coverage, the structure of the consecutive memory backgrounds and the address sequence are very important. This paper defines requirements which have to be taken into account in the background and address sequence selection process. A set of backgrounds which satisfied those requirements guarantee us to achieve a very high fault coverage for multi-background memory testing.
LA - eng
KW - random-access memory (RAM); memory testing; March memory test; neighbourhood pattern sensitive faults; memory address; memory background; Gray code; Hamming distance
UR - http://eudml.org/doc/207889
ER -

References

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