Analysis of multibackground memory testing techniques

Ireneusz Mrozek

International Journal of Applied Mathematics and Computer Science (2010)

  • Volume: 20, Issue: 1, page 191-205
  • ISSN: 1641-876X

Abstract

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March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model-such as pattern sensitive faults-their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.

How to cite

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Ireneusz Mrozek. "Analysis of multibackground memory testing techniques." International Journal of Applied Mathematics and Computer Science 20.1 (2010): 191-205. <http://eudml.org/doc/207973>.

@article{IreneuszMrozek2010,
abstract = {March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model-such as pattern sensitive faults-their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.},
author = {Ireneusz Mrozek},
journal = {International Journal of Applied Mathematics and Computer Science},
keywords = {RAM testing; pattern sensitive faults; March tests; multibackground testing},
language = {eng},
number = {1},
pages = {191-205},
title = {Analysis of multibackground memory testing techniques},
url = {http://eudml.org/doc/207973},
volume = {20},
year = {2010},
}

TY - JOUR
AU - Ireneusz Mrozek
TI - Analysis of multibackground memory testing techniques
JO - International Journal of Applied Mathematics and Computer Science
PY - 2010
VL - 20
IS - 1
SP - 191
EP - 205
AB - March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model-such as pattern sensitive faults-their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.
LA - eng
KW - RAM testing; pattern sensitive faults; March tests; multibackground testing
UR - http://eudml.org/doc/207973
ER -

References

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