A new efficient and flexible algorithm for the design of testable subsystems
Stéphane Ploix; Abed Alrahim Yassine; Jean-Marie Flaus
International Journal of Applied Mathematics and Computer Science (2010)
- Volume: 20, Issue: 1, page 175-190
- ISSN: 1641-876X
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topStéphane Ploix, Abed Alrahim Yassine, and Jean-Marie Flaus. "A new efficient and flexible algorithm for the design of testable subsystems." International Journal of Applied Mathematics and Computer Science 20.1 (2010): 175-190. <http://eudml.org/doc/207972>.
@article{StéphanePloix2010,
abstract = {In complex industrial plants, there are usually many sensors and the modeling of plants leads to lots of mathematical relations. This paper presents a general method for finding all the possible testable subsystems, i.e., sets of relations that can lead to various types of detection tests. This method, which is based on structural analysis, provides the constraints that have to be used for the design of each detection test and manages situations where constraints contain non-deductible variables and where some constraints cannot be gathered in the same test. Thanks to these results, it becomes possible to select the most interesting testable subsystems regarding detectability and diagnosability criteria. Application examples dealing with a road network, a digital counter and an electronic circuit are presented.},
author = {Stéphane Ploix, Abed Alrahim Yassine, Jean-Marie Flaus},
journal = {International Journal of Applied Mathematics and Computer Science},
keywords = {automatic test design; structural approach; fault diagnosis; analytical redundancy relations; relational algebra},
language = {eng},
number = {1},
pages = {175-190},
title = {A new efficient and flexible algorithm for the design of testable subsystems},
url = {http://eudml.org/doc/207972},
volume = {20},
year = {2010},
}
TY - JOUR
AU - Stéphane Ploix
AU - Abed Alrahim Yassine
AU - Jean-Marie Flaus
TI - A new efficient and flexible algorithm for the design of testable subsystems
JO - International Journal of Applied Mathematics and Computer Science
PY - 2010
VL - 20
IS - 1
SP - 175
EP - 190
AB - In complex industrial plants, there are usually many sensors and the modeling of plants leads to lots of mathematical relations. This paper presents a general method for finding all the possible testable subsystems, i.e., sets of relations that can lead to various types of detection tests. This method, which is based on structural analysis, provides the constraints that have to be used for the design of each detection test and manages situations where constraints contain non-deductible variables and where some constraints cannot be gathered in the same test. Thanks to these results, it becomes possible to select the most interesting testable subsystems regarding detectability and diagnosability criteria. Application examples dealing with a road network, a digital counter and an electronic circuit are presented.
LA - eng
KW - automatic test design; structural approach; fault diagnosis; analytical redundancy relations; relational algebra
UR - http://eudml.org/doc/207972
ER -
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