Modeling the tip-sample interaction in atomic force microscopy with Timoshenko beam theory
Julio R. Claeyssen; Teresa Tsukazan; Leticia Tonetto; Daniela Tolfo
Nanoscale Systems: Mathematical Modeling, Theory and Applications (2013)
- Volume: 2, page 124-144
- ISSN: 2299-3290
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topJulio R. Claeyssen, et al. "Modeling the tip-sample interaction in atomic force microscopy with Timoshenko beam theory." Nanoscale Systems: Mathematical Modeling, Theory and Applications 2 (2013): 124-144. <http://eudml.org/doc/266710>.
@article{JulioR2013,
abstract = {A matrix framework is developed for single and multispan micro-cantilevers Timoshenko beam models of use in atomic force microscopy (AFM). They are considered subject to general forcing loads and boundary conditions for modeling tipsample interaction. Surface effects are considered in the frequency analysis of supported and cantilever microbeams. Extensive use is made of a distributed matrix fundamental response that allows to determine forced responses through convolution and to absorb non-homogeneous boundary conditions. Transients are identified from intial values of permanent responses. Eigenanalysis for determining frequencies and matrix mode shapes is done with the use of a fundamental matrix response that characterizes solutions of a damped second-order matrix differential equation. It is observed that surface effects are influential for the natural frequency at the nanoscale. Simulations are performed for a bi-segmented free-free beam and with a micro-cantilever beam actuated by a piezoelectric layer laminated in one side.},
author = {Julio R. Claeyssen, Teresa Tsukazan, Leticia Tonetto, Daniela Tolfo},
journal = {Nanoscale Systems: Mathematical Modeling, Theory and Applications},
keywords = {Atomic force microscopy; nanoscale materials and structures; chemical/biological sensors; nanomachining; microscaled Timoshenko beams; atomic force microscopy},
language = {eng},
pages = {124-144},
title = {Modeling the tip-sample interaction in atomic force microscopy with Timoshenko beam theory},
url = {http://eudml.org/doc/266710},
volume = {2},
year = {2013},
}
TY - JOUR
AU - Julio R. Claeyssen
AU - Teresa Tsukazan
AU - Leticia Tonetto
AU - Daniela Tolfo
TI - Modeling the tip-sample interaction in atomic force microscopy with Timoshenko beam theory
JO - Nanoscale Systems: Mathematical Modeling, Theory and Applications
PY - 2013
VL - 2
SP - 124
EP - 144
AB - A matrix framework is developed for single and multispan micro-cantilevers Timoshenko beam models of use in atomic force microscopy (AFM). They are considered subject to general forcing loads and boundary conditions for modeling tipsample interaction. Surface effects are considered in the frequency analysis of supported and cantilever microbeams. Extensive use is made of a distributed matrix fundamental response that allows to determine forced responses through convolution and to absorb non-homogeneous boundary conditions. Transients are identified from intial values of permanent responses. Eigenanalysis for determining frequencies and matrix mode shapes is done with the use of a fundamental matrix response that characterizes solutions of a damped second-order matrix differential equation. It is observed that surface effects are influential for the natural frequency at the nanoscale. Simulations are performed for a bi-segmented free-free beam and with a micro-cantilever beam actuated by a piezoelectric layer laminated in one side.
LA - eng
KW - Atomic force microscopy; nanoscale materials and structures; chemical/biological sensors; nanomachining; microscaled Timoshenko beams; atomic force microscopy
UR - http://eudml.org/doc/266710
ER -
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