Stochastic foundations of the universal dielectric response

Agnieszka Jurlewicz. "Stochastic foundations of the universal dielectric response." Applicationes Mathematicae 30.3 (2003): 325-336. <http://eudml.org/doc/279736>.

@article{AgnieszkaJurlewicz2003,
abstract = {We present a probabilistic model of the microscopic scenario of dielectric relaxation. We prove a limit theorem for random sums of a special type that appear in the model. By means of the theorem, we show that the presented approach to relaxation phenomena leads to the well known Havriliak-Negami empirical dielectric response provided the physical quantities in the relaxation scheme have heavy-tailed distributions. The mathematical model, presented here in the context of dielectric relaxation, can be applied in the analysis of dynamical properties of other disordered systems.},
author = {Agnieszka Jurlewicz},
journal = {Applicationes Mathematicae},
keywords = {random sum; random index; stable distribution; heavy-tailed distribution; relaxation phenomena},
language = {eng},
number = {3},
pages = {325-336},
title = {Stochastic foundations of the universal dielectric response},
url = {http://eudml.org/doc/279736},
volume = {30},
year = {2003},
}

TY - JOUR
AU - Agnieszka Jurlewicz
TI - Stochastic foundations of the universal dielectric response
JO - Applicationes Mathematicae
PY - 2003
VL - 30
IS - 3
SP - 325
EP - 336
AB - We present a probabilistic model of the microscopic scenario of dielectric relaxation. We prove a limit theorem for random sums of a special type that appear in the model. By means of the theorem, we show that the presented approach to relaxation phenomena leads to the well known Havriliak-Negami empirical dielectric response provided the physical quantities in the relaxation scheme have heavy-tailed distributions. The mathematical model, presented here in the context of dielectric relaxation, can be applied in the analysis of dynamical properties of other disordered systems.
LA - eng
KW - random sum; random index; stable distribution; heavy-tailed distribution; relaxation phenomena
UR - http://eudml.org/doc/279736
ER -