The effect of loss functions on empirical Bayes reliability analysis.
Camara, Vincent A.R.; Tsokos, Chris P.
Mathematical Problems in Engineering (1999)
- Volume: 4, Issue: 6, page 539-560
- ISSN: 1024-123X
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topCamara, Vincent A.R., and Tsokos, Chris P.. "The effect of loss functions on empirical Bayes reliability analysis.." Mathematical Problems in Engineering 4.6 (1999): 539-560. <http://eudml.org/doc/48420>.
@article{Camara1999,
author = {Camara, Vincent A.R., Tsokos, Chris P.},
journal = {Mathematical Problems in Engineering},
keywords = {Weibull; gamma; integrated mean square error; relative efficiency; empirical Bayes},
language = {eng},
number = {6},
pages = {539-560},
publisher = {Hindawi Publishing Corporation, New York},
title = {The effect of loss functions on empirical Bayes reliability analysis.},
url = {http://eudml.org/doc/48420},
volume = {4},
year = {1999},
}
TY - JOUR
AU - Camara, Vincent A.R.
AU - Tsokos, Chris P.
TI - The effect of loss functions on empirical Bayes reliability analysis.
JO - Mathematical Problems in Engineering
PY - 1999
PB - Hindawi Publishing Corporation, New York
VL - 4
IS - 6
SP - 539
EP - 560
LA - eng
KW - Weibull; gamma; integrated mean square error; relative efficiency; empirical Bayes
UR - http://eudml.org/doc/48420
ER -
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