Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.
The journal of Fourier analysis and applications [[Elektronische Ressource]] (1999)
- Volume: 5, Issue: 6, page 575-588
- ISSN: 1069-5869; 1531-5851/e
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topAtreas, N., and Karankias, C.. "Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.." The journal of Fourier analysis and applications [[Elektronische Ressource]] 5.6 (1999): 575-588. <http://eudml.org/doc/59624>.
@article{Atreas1999,
author = {Atreas, N., Karankias, C.},
journal = {The journal of Fourier analysis and applications [[Elektronische Ressource]]},
keywords = {sampling; multiresolution analysis; Gibbs phenomenon},
number = {6},
pages = {575-588},
title = {Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.},
url = {http://eudml.org/doc/59624},
volume = {5},
year = {1999},
}
TY - JOUR
AU - Atreas, N.
AU - Karankias, C.
TI - Gibbs Phenomenon on Sampling Series Based on Shannon's and Meyer's Wavelet Analysis.
JO - The journal of Fourier analysis and applications [[Elektronische Ressource]]
PY - 1999
VL - 5
IS - 6
SP - 575
EP - 588
KW - sampling; multiresolution analysis; Gibbs phenomenon
UR - http://eudml.org/doc/59624
ER -
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