Thick points for transient symmetric stable processes.

Dembo, Amir, et al. "Thick points for transient symmetric stable processes.." Electronic Journal of Probability [electronic only] 4 (1999): Paper No. 10, 13 p.-Paper No. 10, 13 p.. <http://eudml.org/doc/120048>.

@article{Dembo1999,
author = {Dembo, Amir, Rosen, Jay, Peres, Yuval, Zeitouni, Ofer},
journal = {Electronic Journal of Probability [electronic only]},
keywords = {stable process; occupation measure; multifractal spectrum},
language = {eng},
pages = {Paper No. 10, 13 p.-Paper No. 10, 13 p.},
publisher = {University of Washington, Department of Mathematics, Seattle, WA; Duke University, Department of Mathematics, Durham},
title = {Thick points for transient symmetric stable processes.},
url = {http://eudml.org/doc/120048},
volume = {4},
year = {1999},
}

TY - JOUR
AU - Dembo, Amir
AU - Rosen, Jay
AU - Peres, Yuval
AU - Zeitouni, Ofer
TI - Thick points for transient symmetric stable processes.
JO - Electronic Journal of Probability [electronic only]
PY - 1999
PB - University of Washington, Department of Mathematics, Seattle, WA; Duke University, Department of Mathematics, Durham
VL - 4
SP - Paper No. 10, 13 p.
EP - Paper No. 10, 13 p.
LA - eng
KW - stable process; occupation measure; multifractal spectrum
UR - http://eudml.org/doc/120048
ER -