Local detection of defects from image sequences

Ewaryst Rafajłowicz; Marek Wnuk; Wojciech Rafajłowicz

International Journal of Applied Mathematics and Computer Science (2008)

  • Volume: 18, Issue: 4, page 581-592
  • ISSN: 1641-876X

Abstract

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Our aim is to discuss three approaches to the detection of defects in continuous production processes, which are based on local methods of processing image sequences. These approaches are motivated by and applicable to images of hot metals or other surfaces, which are uniform at a macroscopic level, when defects are not present. The first of them is based on the estimation of fractal dimensions of image cross-sections. The second and third approaches are compositions of known techniques, which are selected and tuned to our goal. We discuss their advantages and disadvantages, since they provide different information on defects. The results of their testing on 12 industrial images are also summarized.

How to cite

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Ewaryst Rafajłowicz, Marek Wnuk, and Wojciech Rafajłowicz. "Local detection of defects from image sequences." International Journal of Applied Mathematics and Computer Science 18.4 (2008): 581-592. <http://eudml.org/doc/207910>.

@article{EwarystRafajłowicz2008,
abstract = {Our aim is to discuss three approaches to the detection of defects in continuous production processes, which are based on local methods of processing image sequences. These approaches are motivated by and applicable to images of hot metals or other surfaces, which are uniform at a macroscopic level, when defects are not present. The first of them is based on the estimation of fractal dimensions of image cross-sections. The second and third approaches are compositions of known techniques, which are selected and tuned to our goal. We discuss their advantages and disadvantages, since they provide different information on defects. The results of their testing on 12 industrial images are also summarized.},
author = {Ewaryst Rafajłowicz, Marek Wnuk, Wojciech Rafajłowicz},
journal = {International Journal of Applied Mathematics and Computer Science},
keywords = {image processing; fractal dimension; morphological operations},
language = {eng},
number = {4},
pages = {581-592},
title = {Local detection of defects from image sequences},
url = {http://eudml.org/doc/207910},
volume = {18},
year = {2008},
}

TY - JOUR
AU - Ewaryst Rafajłowicz
AU - Marek Wnuk
AU - Wojciech Rafajłowicz
TI - Local detection of defects from image sequences
JO - International Journal of Applied Mathematics and Computer Science
PY - 2008
VL - 18
IS - 4
SP - 581
EP - 592
AB - Our aim is to discuss three approaches to the detection of defects in continuous production processes, which are based on local methods of processing image sequences. These approaches are motivated by and applicable to images of hot metals or other surfaces, which are uniform at a macroscopic level, when defects are not present. The first of them is based on the estimation of fractal dimensions of image cross-sections. The second and third approaches are compositions of known techniques, which are selected and tuned to our goal. We discuss their advantages and disadvantages, since they provide different information on defects. The results of their testing on 12 industrial images are also summarized.
LA - eng
KW - image processing; fractal dimension; morphological operations
UR - http://eudml.org/doc/207910
ER -

References

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