Displaying similar documents to “On the mathematical basis of the linear sampling method.”

A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions

Nguyen Thanh Tien, Pham Thi Bich Thao, Le Tuan (2014)

Nanoscale Systems: Mathematical Modeling, Theory and Applications

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We propose a modification of the interface roughness (IFR) scattering form factor in intersubband transitions.We properly derived a formula for the form factor for IFR scattering in terms of the integrals of the envelope wave functions. This novel form factor is more global nature than the old one (proposed by Ando) and may be suitable for a wide range of applications. In this paper, we calculate and compare the absorption linewidth with the application of the old form factor and novel...

Inverse Scattering for Waveguides

Hiroshi Isozaki, Yaroslav Kurylev, Matti Lassas (2006-2007)

Séminaire de théorie spectrale et géométrie

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We study the inverse scattering problem for a waveguide ( M , g ) with cylindrical ends, M = M c α = 1 N ( Ω α × ( 0 , ) ) , where each Ω α × ( 0 , ) has a product type metric. We prove, that the physical scattering matrix, measured on just one of these ends, determines ( M , g ) up to an isometry.