Spectral Analysis Using Ascent, Descent, Nullity and Defect.
Mathematische Annalen (1970)
- Volume: 184, page 197-214
- ISSN: 0025-5831; 1432-1807/e
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topLAY, D.C.. "Spectral Analysis Using Ascent, Descent, Nullity and Defect.." Mathematische Annalen 184 (1970): 197-214. <http://eudml.org/doc/161923>.
@article{LAY1970,
author = {LAY, D.C.},
journal = {Mathematische Annalen},
keywords = {functional analysis},
pages = {197-214},
title = {Spectral Analysis Using Ascent, Descent, Nullity and Defect.},
url = {http://eudml.org/doc/161923},
volume = {184},
year = {1970},
}
TY - JOUR
AU - LAY, D.C.
TI - Spectral Analysis Using Ascent, Descent, Nullity and Defect.
JO - Mathematische Annalen
PY - 1970
VL - 184
SP - 197
EP - 214
KW - functional analysis
UR - http://eudml.org/doc/161923
ER -
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