Bernoulli cluster field: Voronoi tessellations
A new point process is proposed which can be viewed either as a Boolean cluster model with two cluster modes or as a -thinned Neyman-Scott cluster process with the retention of the original parent point. Voronoi tessellation generated by such a point process has extremely high coefficients of variation of cell volumes as well as of profile areas and lengths in the planar and line induced tessellations. An approximate numerical model of tessellation characteristics is developed for the case of small...