Mathematical modelling of ultrasonic non-destructive evaluation.
Modeling the tip-sample interaction in atomic force microscopy with Timoshenko beam theory
A matrix framework is developed for single and multispan micro-cantilevers Timoshenko beam models of use in atomic force microscopy (AFM). They are considered subject to general forcing loads and boundary conditions for modeling tipsample interaction. Surface effects are considered in the frequency analysis of supported and cantilever microbeams. Extensive use is made of a distributed matrix fundamental response that allows to determine forced responses through convolution and to absorb non-homogeneous...